Electron Microscopy at Very High Resolution
نویسندگان
چکیده
Transmission electron microscopy (TEM) is one of the most frequently used tools for the characterization of nanomaterials. Aberration-correction has revolutionized the field of electron microscopy and now equipment is commercially available providing sub-Gngström resolution and single atom sensitivity for atomic, electronic, and chemical structure analyses. In this entry, aberration-corrected scanning transmission electron microscopy and related techniques are reviewed in the framework of nanomaterials sciences. Three examples from the areas of catalysis, hydrogen storage, and nanoscale thin films, are used to demonstrate experimental capabilities and current resolution limits.
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